Sayil

Noise Contamination in Nanoscale VLSI Circuits

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53.49 €

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Fachbuch

Buch. Softcover

2023

xi, 136 S. 53 s/w-Abbildungen, 42 Farbabbildungen, Bibliographien.

In englischer Sprache

Springer. ISBN 978-3-031-12753-3

Format (B x L): 16,8 x 24 cm

Gewicht: 262 g

Das Werk ist Teil der Reihe: Synthesis Lectures on Digital Circuits & Systems

Produktbeschreibung

This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.